AJP - GI -- Index by Author (May 2004; Volume 286, Number 5)

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Index by Author: 1 May 2004; 286 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: An, Jae-Koo [Abstract] [Full Text]
B: Ballatori, Nazzareno [Abstract] [Full Text]; Barrett, Kim E. [Abstract] [Full Text]; Barrett, Kim E. [Abstract] [Full Text]; Bitar, Khalil N. [Abstract] [Full Text]; Bleiziffer, O. [Abstract] [Full Text]; Blomenkamp, Keith [Abstract] [Full Text]; Bloom, Steve [Abstract] [Full Text]; Bollineni, Jaya [Abstract] [Full Text]; Bordel, R. [Abstract] [Full Text]; Boucher, Marie-Josée [Abstract] [Full Text]; Boyer, James [Abstract] [Full Text]
C: Cao, Weibiao [Abstract] [Full Text]; Cheng, Hsin-Lin [Abstract] [Full Text]; Chow, Jimmy Y. C. [Abstract] [Full Text]; Christman, Gregory M. [Abstract] [Full Text]; Cushing, Kelly [Abstract] [Full Text]
D: Del Valle, Juan C. [Abstract] [Full Text]; Dellian, M. [Abstract] [Full Text]; Deutz, Nicolaas E. P. [Abstract] [Full Text]; Dwinell, Michael B. [Abstract] [Full Text]
E: Eipel, C. [Abstract] [Full Text]; Elferink, Ronald P. J. Oude [Abstract] [Full Text]
F: Felíu, Juan E. [Abstract] [Full Text]; Fiocchi, Claudio [Abstract] [Full Text]; Fiocchi, Claudio [Abstract] [Full Text]; Fricker, Gert [Abstract] [Full Text]; Fried, Michael [Abstract] [Full Text]; Fukushima, Kouhei [Abstract] [Full Text]
G: Gutiérrez, Yolanda [Abstract] [Full Text]
H: Hagenbuch, Bruno [Abstract] [Full Text]; Hallemeesch, Marcella M. [Abstract] [Full Text]; Havinga, Rick [Abstract] [Full Text]; Hoffmann, T. [Abstract] [Full Text]; Hokari, Ryota [Abstract] [Full Text]; Holloway, Richard H. [Abstract] [Full Text]; Honda, Akira [Abstract] [Full Text]; Horowitz, Michael [Abstract] [Full Text]; Hou, Yong Tai [Abstract] [Full Text]
I: Inamura, Toshiaki [Abstract] [Full Text]; Isenberg, Jon I. [Abstract] [Full Text]; Ishii, Hiromasa [Abstract] [Full Text]
J: Jean, Dominique [Abstract] [Full Text]; Jung, Diana [Abstract] [Full Text]
K: Kagnoff, Martin F. [Abstract] [Full Text]; Kao, John Y. [Abstract] [Full Text]; Keenan, Catherine M. [Abstract] [Full Text]; Kirber, Michael T. [Abstract] [Full Text]; Kuipers, Folkert [Abstract] [Full Text]; Kullak-Ublick, Gerd A. [Abstract] [Full Text]
L: Lamers, Wouter H. [Abstract] [Full Text]; Li, Hai [Abstract] [Full Text]; Li, Lina [Abstract] [Full Text]; Liddle, Rodger A. [Abstract] [Full Text]
M: Mackie, Ken [Abstract] [Full Text]; MacNaughton, Wallace K. [Abstract] [Full Text]; Matsuzaki, Yasushi [Abstract] [Full Text]; Meier, Peter J. [Abstract] [Full Text]; Menger, M. D. [Abstract] [Full Text]; Merchant, Juanita L. [Abstract] [Full Text]; Messmer, K. [Abstract] [Full Text]; Miura, Soichiro [Abstract] [Full Text]
N: Nagata, Hiroshi [Abstract] [Full Text]; Nickels, R. M. [Abstract] [Full Text]
O: Ogawa, Hiroyuki [Abstract] [Full Text]; Ogawa, Toshiko [Abstract] [Full Text]; Ogino, Takashi [Abstract] [Full Text]; Ottenhoff, Roelof [Abstract] [Full Text]
P: Pahernik, S. [Abstract] [Full Text]; Pan, Lu-xing [Abstract] [Full Text]; Pereda, Carmen [Abstract] [Full Text]; Perlmutter, David [Abstract] [Full Text]; Pricolo, Victor E. [Abstract] [Full Text]
R: Rankin, Erinn B. [Abstract] [Full Text]; Rayner, Christopher [Abstract] [Full Text]; Rigda, Rachael [Abstract] [Full Text]; Rivard, Nathalie [Abstract] [Full Text]; Rossi, Irma [Abstract] [Full Text]
S: Salen, Gerald [Abstract] [Full Text]; Salvatella, María [Abstract] [Full Text]; Samper, Begoña [Abstract] [Full Text]; Samuelson, Linda C. [Abstract] [Full Text]; Schmidt, Bela [Abstract] [Full Text]; Schmiedlin-Ren, Phyllissa [Abstract] [Full Text]; Seward, David J. [Abstract] [Full Text]; Shang, Quan [Abstract] [Full Text]; Sharkey, Keith A. [Abstract] [Full Text]; She, Hongyun [Abstract] [Full Text]; Shefer, Sarah [Abstract] [Full Text]; Silberg, Debra G. [Abstract] [Full Text]; Soeters, Peter B. [Abstract] [Full Text]; Stanley, Sarah [Abstract] [Full Text]; Suh, EunRan [Abstract] [Full Text]; Sung, Chin K. [Abstract] [Full Text]
T: Tashiro, Mitsuo [Abstract] [Full Text]; Teckman, Jeffrey H. [Abstract] [Full Text]; Teramoto, Ken [Abstract] [Full Text]; Tint, G. Stephen [Abstract] [Full Text]; Tsukamoto, Hidekazu [Abstract] [Full Text]; Tsuzuki, Yoshikazu [Abstract] [Full Text]; Tuo, Bi-Guang [Abstract] [Full Text]
V: Van Sickle, Marja D. [Abstract] [Full Text]; Verkade, Henkjan J. [Abstract] [Full Text]; Vézina, Anne [Abstract] [Full Text]; Vissers, Yvonne L. J. [Abstract] [Full Text]; Vollmar, B. [Abstract] [Full Text]; von Dobschuetz, E. [Abstract] [Full Text]; Vrees, Matthew D. [Abstract] [Full Text]
W: Watanabe, Chikako [Abstract] [Full Text]; Werner, Anniek [Abstract] [Full Text]; Williams, John A. [Abstract] [Full Text]; Worynski, Andrew [Abstract] [Full Text]; Wynne, Katie [Abstract] [Full Text]
X: Xin, Xiping [Abstract] [Full Text]; Xiong, Shigang [Abstract] [Full Text]; Xu, Guorong [Abstract] [Full Text]; Xu, Wei [Abstract] [Full Text]
Z: Zavros, Yana [Abstract] [Full Text]; Zhang, Qing [Abstract] [Full Text]; Zimmermann, Ellen M. [Abstract] [Full Text]