AJP - GI -- Index by Author (Feb 2007; Volume 292, Number 2)

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Index by Author: 1 February 2007; 292 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Al-Sadi, Rana [Abstract] [Full Text]; Alvarez, Carlos E. [Abstract] [Full Text]
B: Bayguinov, Peter [Abstract] [Full Text]; Bisschops, Raf [Abstract] [Full Text]; Blackshaw, L. Ashley [Abstract] [Full Text]; Blikslager, Anthony T. [Abstract] [Full Text]; Boivin, Michel A. [Abstract] [Full Text]; Brun, Paola [Abstract] [Full Text]; Buda, Andrea [Abstract] [Full Text]
C: Cassiman, David [Abstract] [Full Text]; Castagliuolo, Ignazio [Abstract] [Full Text]; Chaudry, Irshad H. [Abstract] [Full Text]; Coon, Steven [Abstract] [Full Text]; Coon, Steven [Abstract] [Full Text]; Cooper, Nicole J. [Abstract] [Full Text]
D: Dalmasso, Guillaume [Abstract] [Full Text]; Den-Boer, Debbie [Abstract] [Full Text]; Dimitrios, Karussis [Abstract] [Full Text]; Doron, Sarit [Abstract] [Full Text]; Duckworth, C. A. [Abstract] [Full Text]
E: Eddinger, Thomas J. [Abstract] [Full Text]; Elst, Ingrid Vander [Abstract] [Full Text]; Engelke, Kory J. [Abstract] [Full Text]; Ernst, Stephen A. [Abstract] [Full Text]
F: Fevery, Johan [Abstract] [Full Text]; Friedman, Scott L. [Abstract] [Full Text]; Fujii, Hideaki [Abstract] [Full Text]; Fujita, Naoya [Abstract] [Full Text]
G: Gao, Chuanyun [Abstract] [Full Text]; Gao, Na [Abstract] [Full Text]; Geller, David A. [Abstract] [Full Text]; Gonzalez, Frank J. [Abstract] [Full Text]; Guo, Lili [Abstract] [Full Text]; Gurda, Grzegorz T. [Abstract] [Full Text]
H: Handa, Osamu [Abstract] [Full Text]; Harada, Naoaki [Abstract] [Full Text]; Hennig, Grant W. [Abstract] [Full Text]; Hoppo, Toshitaka [Abstract] [Full Text]; Horani, Amjad [Abstract] [Full Text]; Hu, Hong-Zhen [Abstract] [Full Text]; Hyland, Niall P. [Abstract] [Full Text]
I: Ichikawa, Hiroshi [Abstract] [Full Text]; Ikai, Iwao [Abstract] [Full Text]; Ikeda, Atsushi [Abstract] [Full Text]; Ishii, Takamichi [Abstract] [Full Text]
J: Jeyabalan, Geetha [Abstract] [Full Text]; Jung, Sung-Ae [Abstract] [Full Text]
K: Kaizu, Takahashi [Abstract] [Full Text]; Kamo, Naoko [Abstract] [Full Text]; Katada, Kazuhiro [Abstract] [Full Text]; Kawai, Satoru [Abstract] [Full Text]; Kawai, Toru [Abstract] [Full Text]; Kennedy, John C. [Abstract] [Full Text]; Kokura, Satoshi [Abstract] [Full Text]; Kubo, Hajime [Abstract] [Full Text]
L: Laleman, Wim [Abstract] [Full Text]; Lee, Hyun-Tai [Abstract] [Full Text]; Lee, Sae-Hong [Abstract] [Full Text]; Leo, Vincenza Di [Abstract] [Full Text]; Li, Zhaodong [Abstract] [Full Text]; Liu, Sumei [Abstract] [Full Text]; Lomax, Alan E. [Abstract] [Full Text]
M: Ma, Thomas Y. [Abstract] [Full Text]; Machimoto, Takafumi [Abstract] [Full Text]; Martines, Diego [Abstract] [Full Text]; Mawe, Gary M. [Abstract] [Full Text]; Melhem, Alaa [Abstract] [Full Text]; Merlin, Didier [Abstract] [Full Text]; Mittal, Ravinder K. [Abstract] [Full Text]; Mizuno, Shinya [Abstract] [Full Text]; Moeser, Adam J. [Abstract] [Full Text]; Morimura, Keiichirou [Abstract] [Full Text]; Morris, Andrew P. [Abstract] [Full Text]; Muhanna, Nidal [Abstract] [Full Text]; Murase, Noriko [Abstract] [Full Text]
N: Nagasaka, Tetsuro [Abstract] [Full Text]; Nager, Charles W. [Abstract] [Full Text]; Nagino, Masato [Abstract] [Full Text]; Naito, Yuji [Abstract] [Full Text]; Nakamura, Toshikazu [Abstract] [Full Text]; Neish, Andrew S. [Abstract] [Full Text]; Nevens, Frederik [Abstract] [Full Text]; Nighot, Prashant K. [Abstract] [Full Text]; Nimura, Yuji [Abstract] [Full Text]
O: O'Donnell, Tracey A. [Abstract] [Full Text]; O'Hara, Jennifer R. [Abstract] [Full Text]; Oda, Koji [Abstract] [Full Text]; Okajima, Kenji [Abstract] [Full Text]
P: Padda, Bikram S. [Abstract] [Full Text]; Page, Amanda J. [Abstract] [Full Text]; Palù, Giorgio [Abstract] [Full Text]; Pappo, Orit [Abstract] [Full Text]; Park, Kyu Joo [Abstract] [Full Text]; Pinzani, Massimo [Abstract] [Full Text]; Pretorius, Dolores [Abstract] [Full Text]; Pritchard, D. M. [Abstract] [Full Text]; Przemeck, S. M. C. [Abstract] [Full Text]
R: Reed, David E. [Abstract] [Full Text]; Reid, Kaye M. [Abstract] [Full Text]; Roskams, Tania [Abstract] [Full Text]
S: Safadi, Rifaat [Abstract] [Full Text]; Sanders, Kenton M. [Abstract] [Full Text]; Sans, Maria Dolors [Abstract] [Full Text]; Sarna, Sushil K. [Abstract] [Full Text]; Schiebout, Jessen D. [Abstract] [Full Text]; Sellin, Joseph H. [Abstract] [Full Text]; Severi, Tamara [Abstract] [Full Text]; Shah, Yatrik M. [Abstract] [Full Text]; Shao, Guohong [Abstract] [Full Text]; Shao, Lifang [Abstract] [Full Text]; Sharkey, Keith A. [Abstract] [Full Text]; Shepela, Chris [Abstract] [Full Text]; Shimozawa, Nobuhiko [Abstract] [Full Text]; Sitaraman, Shanthi [Abstract] [Full Text]; Smith, Terence K. [Abstract] [Full Text]; Spencer, Nick J. [Abstract] [Full Text]; Sternini, Catia [Abstract] [Full Text]; Sundaram, Uma [Abstract] [Full Text]; Sundaram, Uma [Abstract] [Full Text]; Swartz, Darl R. [Abstract] [Full Text]
T: Takagi, Tomohisa [Abstract] [Full Text]; Tsuboi, Hisato [Abstract] [Full Text]; Tsukada, Minoru [Abstract] [Full Text]; Tsung, Allan [Abstract] [Full Text]; Tsuruo, Takashi [Abstract] [Full Text]
U: Ueno, Ryuji [Abstract] [Full Text]; Umar, Shahid [Abstract] [Full Text]
V: Van Landeghem, Lien [Abstract] [Full Text]; Van Pelt, Jos [Abstract] [Full Text]; Vanner, Stephen [Abstract] [Full Text]; Vulaupalli, Raju [Abstract] [Full Text]
W: Wang, Yu [Abstract] [Full Text]; Wehbi, Wehbi [Abstract] [Full Text]; Williams, John A. [Abstract] [Full Text]; Wisel, Sheik [Abstract] [Full Text]; Wisel, Sheik [Abstract] [Full Text]; Wood, Jackie D. [Abstract] [Full Text]; Wu, Guoyao [Abstract] [Full Text]
X: Xia, Yun [Abstract] [Full Text]
Y: Yamashita, Jun K. [Abstract] [Full Text]; Yan, Yutao [Abstract] [Full Text]; Yasuchika, Kentaro [Abstract] [Full Text]; Ye, Dongmei [Abstract] [Full Text]; Yokoyama, Shinya [Abstract] [Full Text]; Yokoyama, Yukihiro [Abstract] [Full Text]; Yoshida, Norimasa [Abstract] [Full Text]; Yoshikawa, Toshikazu [Abstract] [Full Text]; Young, Richard L. [Abstract] [Full Text]
Z: Zeegers, Marcel [Abstract] [Full Text]